Choose the technique, then confirm the instrument platform

Each section links to the detailed technique page and to the relevant instrument/platform group on the by-instrument page. This keeps the technique decision connected to the actual analytical platform used to generate the evidence.

Chromatography

High-performance liquid chromatography (HPLC), ultra-high-performance liquid chromatography (UPLC), gas chromatography (GC), thin-layer chromatography (TLC), preparative liquid chromatography (LC), assay, impurity, residual-solvent, and mixture-separation workflows.

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Elemental Analysis

Inductively coupled plasma mass spectrometry (ICP-MS), scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM/EDX), X-ray fluorescence (XRF), particle-induced X-ray emission (PIXE), inorganic impurity, contaminant, and localized elemental analysis.

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Mass Spectrometry

Liquid chromatography/mass spectrometry (LC/MS), gas chromatography/mass spectrometry (GC/MS), high-resolution mass spectrometry (HRMS), matrix-assisted laser desorption/ionization (MALDI), inductively coupled plasma mass spectrometry (ICP-MS), unknown identification, molecular-weight, trace, and impurity workflows.

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Microscopy

Optical microscopy, polarized light microscopy (PLM), scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM/EDX), hot-stage microscopy, atomic force microscopy (AFM), morphology, contaminant, and surface investigations.

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Spectroscopy

Raman spectroscopy, Fourier-transform Raman (FT-Raman), low-frequency Raman, Fourier-transform infrared (FTIR) spectroscopy, infrared (IR) imaging, ultraviolet/visible (UV/Vis) spectroscopy, molecular fingerprinting, and chemical mapping.

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Thermal Analysis

Differential scanning calorimetry (DSC), thermogravimetric analysis (TGA), TGA-infrared (TGA-IR), hot-stage microscopy, microcalorimetry, transition, moisture/volatile, and stability-relevant thermal data.

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Compare techniques by instrument platform

Use the by-instrument page to see which analytical service pages apply to each platform or detector family.

View by instrument
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